ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,691, issued on Oct. 27, was assigned to MARX Crypto Tech LP (Buford, Ga.). "Device, method, computer program and system for authorizing a c... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,692, issued on Oct. 27, was assigned to AffinitiQuest.io (Ottawa). "System and method for distributed management of consumer data" was inve... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,693, issued on Oct. 27, was assigned to AT&T Intellectual Property I LP (Atlanta). "Access to cloud-distributed applications via access cre... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,694, issued on Oct. 27, was assigned to Adobe Inc. (San Jose, Calif.). "Character entry pause time for passwords" was invented by Nader Nas... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,775,695, issued on Oct. 27, was assigned to FORTINET INC. (Sunnyvale, Calif.). "Code integrity verification mechanism" was invented by Omri Mis... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,879, issued on Oct. 27, was assigned to Carl Zeiss Industrielle Messtechnik GmbH (Oberkochen, Germany). "Automated test plan validation for... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,880, issued on Oct. 27, was assigned to ANALOG DEVICES INTERNATIONAL UNLtd. COMPANY (Limerick, Ireland). "Magnetic sensor system" was inven... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,881, issued on Oct. 27, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Multi-purpose confocal sensor systems" was invented ... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,882, issued on Oct. 27, was assigned to PRECITEC OPTRONIK GMBH (Neu-Isenburg, Germany). "Method and device for measuring optical thickness"... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,883, issued on Oct. 27, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Sample thickness metrology using focused beam interf... Read More